Automated Linescan Analysis for CMP Modeling

Information Modeling for Automated Risk Analysis

Systematic security risk analysis requires an information model which integrates the system design, the security environment (the attackers, security goals etc) and proposed security requirements. Such a model must be scalable to accommodate large systems, and support the efficient discovery of threat paths and the production of risk-based metrics; the modeling approach must balance complexity,...

Automated error analysis for the agilization of feature modeling

Formal Modeling of Diffie-Hellman Derivability for Exploratory Automated Analysis

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Full Profile Inter-Layer Dielectric CMP Analysis

Chemical Mechanical Polishing (CMP) is currently being used in the fabrication of state-of-the-art integrated circuits, and has been identified as an enabling technology for the semiconductor industry in its drive toward gigabit chips and sub-130nm feature sizes. In this project we present the application of a library-based specular spectroscopic scatterometry method, which is capable of gettin...

Performance and Power Aware CMP Thread Allocation Modeling

We address the problem of performance and power-efficient thread allocation in a CMP. To that end, based on analytical model, we introduce a parameterized performance/power metric that can be adjusted according to a preferred tradeoff between performance and power. We introduce an iterative threshold algorithm (ITA) for allocating threads to cores in the case of a single application with symmet...